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AP-MOVPE GaInSb: Influence of V/III ratio on quality and indium incorporation

Identifieur interne : 001185 ( Main/Repository ); précédent : 001184; suivant : 001186

AP-MOVPE GaInSb: Influence of V/III ratio on quality and indium incorporation

Auteurs : RBID : Pascal:13-0201288

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English descriptors

Abstract

The growth of atmospheric pressure metal-organic vapour phase epitaxial (AP-MOVPE) GaSb and Ga1-xInxSb layers with different nominal V/III ratios (1.0-2.0) at 550 °C, using trimethylantimony (TMSb), trimethylindium (TMIn) and triethylgallium (TEGa), is being reported. Ga1-xInxSb layers were grown with a constant indium mole fraction in the vapour phase (xv) in order to study the dependence of the indium mole fraction in the solid (x) on the V/III ratio. The surface morphology, crystallinity and optical properties of these layers are compared to those of GaSb layers with the aim of understanding their level of sensitivity to changes in the V/III ratio. It has been observed that the indium incorporation into GaSb increases with an increase in the V/III ratio. The shift of the free exciton/band-to-band transition in Ga0.96In0.04Sb with temperature follows the Varshni relation: E(T)=0.777-7.559 × 10-4T2/(720+T).

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<title xml:lang="en" level="a">AP-MOVPE GaInSb: Influence of V/III ratio on quality and indium incorporation</title>
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<name sortKey="Miya, S S" uniqKey="Miya S">S. S. Miya</name>
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<name sortKey="Wagener, V" uniqKey="Wagener V">V. Wagener</name>
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<name sortKey="Botha, J R" uniqKey="Botha J">J. R. Botha</name>
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<term>Atmospheric pressure</term>
<term>Crystallinity</term>
<term>Epitaxial layers</term>
<term>Excitons</term>
<term>Gallium antimonides</term>
<term>Growth mechanism</term>
<term>III-V compound</term>
<term>III-V semiconductors</term>
<term>Indium</term>
<term>MOVPE method</term>
<term>Optical properties</term>
<term>Organometallic compounds</term>
<term>Surface morphology</term>
<term>VPE</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr">
<term>Méthode MOVPE</term>
<term>Epitaxie phase vapeur</term>
<term>Mécanisme croissance</term>
<term>Pression atmosphérique</term>
<term>Composé organométallique</term>
<term>Couche épitaxique</term>
<term>Semiconducteur III-V</term>
<term>Composé III-V</term>
<term>Indium</term>
<term>Morphologie surface</term>
<term>Cristallinité</term>
<term>Propriété optique</term>
<term>Exciton</term>
<term>Antimoniure de gallium</term>
<term>GaInSb</term>
<term>Substrat indium</term>
<term>GaSb</term>
<term>Ga1-xInxSb</term>
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<div type="abstract" xml:lang="en">The growth of atmospheric pressure metal-organic vapour phase epitaxial (AP-MOVPE) GaSb and Ga
<sub>1-x</sub>
In
<sub>x</sub>
Sb layers with different nominal V/III ratios (1.0-2.0) at 550 °C, using trimethylantimony (TMSb), trimethylindium (TMIn) and triethylgallium (TEGa), is being reported. Ga
<sub>1-x</sub>
In
<sub>x</sub>
Sb layers were grown with a constant indium mole fraction in the vapour phase (x
<sub>v</sub>
) in order to study the dependence of the indium mole fraction in the solid (x) on the V/III ratio. The surface morphology, crystallinity and optical properties of these layers are compared to those of GaSb layers with the aim of understanding their level of sensitivity to changes in the V/III ratio. It has been observed that the indium incorporation into GaSb increases with an increase in the V/III ratio. The shift of the free exciton/band-to-band transition in Ga
<sub>0.96</sub>
In
<sub>0.04</sub>
Sb with temperature follows the Varshni relation: E(T)=0.777-7.559 × 10
<sup>-4</sup>
T
<sup>2</sup>
/(720+T).</div>
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<s0>The growth of atmospheric pressure metal-organic vapour phase epitaxial (AP-MOVPE) GaSb and Ga
<sub>1-x</sub>
In
<sub>x</sub>
Sb layers with different nominal V/III ratios (1.0-2.0) at 550 °C, using trimethylantimony (TMSb), trimethylindium (TMIn) and triethylgallium (TEGa), is being reported. Ga
<sub>1-x</sub>
In
<sub>x</sub>
Sb layers were grown with a constant indium mole fraction in the vapour phase (x
<sub>v</sub>
) in order to study the dependence of the indium mole fraction in the solid (x) on the V/III ratio. The surface morphology, crystallinity and optical properties of these layers are compared to those of GaSb layers with the aim of understanding their level of sensitivity to changes in the V/III ratio. It has been observed that the indium incorporation into GaSb increases with an increase in the V/III ratio. The shift of the free exciton/band-to-band transition in Ga
<sub>0.96</sub>
In
<sub>0.04</sub>
Sb with temperature follows the Varshni relation: E(T)=0.777-7.559 × 10
<sup>-4</sup>
T
<sup>2</sup>
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<s5>09</s5>
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<s0>Indium</s0>
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<s5>10</s5>
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<s5>11</s5>
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<s5>11</s5>
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<s5>11</s5>
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<s5>12</s5>
</fC03>
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<s5>12</s5>
</fC03>
<fC03 i1="13" i2="3" l="FRE">
<s0>Exciton</s0>
<s5>13</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG">
<s0>Excitons</s0>
<s5>13</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE">
<s0>Antimoniure de gallium</s0>
<s2>NK</s2>
<s5>15</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG">
<s0>Gallium antimonides</s0>
<s2>NK</s2>
<s5>15</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE">
<s0>GaInSb</s0>
<s4>INC</s4>
<s5>46</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE">
<s0>Substrat indium</s0>
<s4>INC</s4>
<s5>47</s5>
</fC03>
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<s0>GaSb</s0>
<s4>INC</s4>
<s5>48</s5>
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<s0>Ga1-xInxSb</s0>
<s4>INC</s4>
<s5>49</s5>
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<fC03 i1="19" i2="3" l="FRE">
<s0>In</s0>
<s4>INC</s4>
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<s5>73</s5>
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<s5>74</s5>
</fC03>
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</fN21>
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<fN82>
<s1>OTO</s1>
</fN82>
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<pR>
<fA30 i1="01" i2="1" l="ENG">
<s1>ICMOVPE-XVI International Conference on Metalorganic Vapor Phase Epitaxy</s1>
<s2>16</s2>
<s3>Busan KOR</s3>
<s4>2012-05-20</s4>
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